Closed-Cycle Vertical Field Superconducting Magnet Probe Station|SeeweTek | Magnetic Field Generators, Magnetic Testing Solutions, Physical Property Testing Solutions

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Closed-Cycle Vertical Field Superconducting Magnet Probe Station
Description:Probe stations are essential high-tech scientific research equipment in fields such as semiconductors, MEMS, and superconducting material detection, playing an irreplaceable role.
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Probe stations are essential high-tech scientific research equipment in fields such as semiconductors, MEMS, and superconducting material detection, playing an irreplaceable role.

With micron-level probe tips and optical microscopes, they enable low-temperature physical electrical testing, microwave detection, and visual imaging at the mesoscopic level of materials.

IV and CV curve testing, microwave testing, photoelectric testing, Hall effect testing, and other material research in variable temperature ranges.

This equipment provides a low-temperature, vacuum, and magnetic field environment that can introduce electrical, optical, and microwave signals. Signals are introduced via probe arms, low-temperature refrigeration is achieved by a closed-cycle cryocooler, vacuum environment is provided by a vacuum Dewar, and high-intensity magnetic field is provided by a superconducting magnet.


Core Technologies

Superconducting Magnet Technology

The closed-cycle vertical field superconducting magnet probe station achieves a magnetic field of up to 3T. Through an independently developed optimization design algorithm under electromagnetic-mechanical-thermal multi-physics coupling, a compact superconducting magnet system with low loss and high stability is designed and fabricated.

Fast Cooling and High Conductivity Refrigeration Technology

The low-temperature system uses a two-stage G-M cryocooler for cooling. The thermal conduction structure and heat sink structure achieve high thermal uniformity and low system heat leakage; a thermal switch technology is used to achieve rapid cooling in the 4K temperature range.

Thermal Switch Technology

Low-temperature thermal switch technology enables rapid temperature control of the sample stage.


Application Areas

Semiconductor wafers, condensed matter physics, photoelectric testing, superconducting materials, nanoelectronics, magnetism & spintronics, organic & molecular electronics, quantum devices, microwave electronics, low-noise RF, ferroelectric thin films, cryoelectronics.

Magnetic Field Parameters
Back Field Magnet TypeSuperconducting Magnet
Sample Magnetic Field Strength±3T
Magnetic Field Uniformity0.5% over 10mm diameter; 0.7% over 25mm diameter
Temperature System Parameters
Temperature RangeWithout magnetic field: 4.2K-300K; With magnetic field: 10K-300K
Cooling Source2-stage G-M cryocooler, 1.2W@4.2K
TypeSample + radiation shield
Radiation ShieldMain radiation shield
Temperature Control Stability<10K ±50mK
10K-100K ±20mK
101K-250K ±15mK
251K-300K ±15mK
Temperature Sensors2, for temperature monitoring of sample stage and probe arms
Vacuum Parameters
Pump-down Time15~30 min
Cool-down Time10 H
Warm-up Time2 H
At Room Temperature<5×10-4 TORR
At Maximum Temperature<1×10-5 TORR
Vacuum Chamber Parameters
MaterialStainless Steel
Chamber Size200—250mm diameter
ViewportHigh-transmission anti-infrared absorption quartz glass
Viewport Sizeφ72mm
Vacuum PortKF25
Gas Port0.25NPT
Radiation Shield
MaterialElectroless Nickel-Plated Aluminum
Observation Window50mm
Visible Area Size50mm
Sample Stage and Sample
Sample Stage TypeGrounded Sample Holder
Sample Stage SizeUp to 46 mm
Bottom IlluminationNo
Probe Arms
Number of Probe Arms6
X, Y, Z Travel50mm-50mm-50mm, larger travel ranges available upon request
Precision±1 micron
DC ProbesLow-noise coaxial probes, electrical insulation >100G
RF ProbesDC-50GHz, DC-67GHz, or higher
Fiber Optic ArmAvailable for photoelectric testing
Probe Tips
Type6
DC Hard ProbesNeedle diameter: 0.51mm
Tip radius (selectable): <0.5um, <1um, <2um
DC Soft Probes<5um, <10um, <20um, <50um, <100um
Model 1: Needle diameter: 5um, tip radius <0.1um, needle length: 3.3mm
Model 2: Needle diameter: 10um, tip radius <0.1um, needle length: 3.3mm
Model 3: Needle diameter: 22um, tip radius <1um, needle length: 5.1mm
Model 4: Needle diameter: 35um, tip radius <2um, needle length: 5.1mm
Model 5: Needle diameter: 60um, tip radius <3um, needle length: 5.1mm
Model 6: Needle diameter: 125um, tip radius <5um, needle length: 5.1mm
RF ProbesDC-40GHz, DC-50GHz, DC-67GHz, DC-110GHz
Tip configuration: GS/SG/GSG
DC Triaxial Probe HolderLeakage current <100fA, max current 10A, max voltage 1500V
RF Probe HolderLeakage current <100fA, max current 2A, max voltage 50V