JH60C Hall Effect Test System - Electromagnet Type|SeeweTek | Magnetic Field Generators, Magnetic Testing Solutions, Physical Property Testing Solutions

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JH60C Hall Effect Test System - Electromagnet Type
Description:The Hall Effect Test System is used to measure key parameters of semiconductor materials, such as carrier concentration, mobility, resistivity, and Hall coefficient. These parameters are essential for understanding the electrical properties of semiconductor materials, making this system an indispensable tool for studying semiconductor devices and materials. This instrument offers stable performance, powerful functionality, and high cost-effectiveness. It is widely used and well-known in universities, research institutes, and the semiconductor industry. Compact and portable, it is primarily used to measure important characteristic parameters of electronic materials, including carrier concentration, mobility, resistivity, and Hall coefficient, for both thin films and solid materials.
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Product Composition

This system consists of: laboratory electromagnet, high-precision bipolar power supply, built-in gaussmeter, Keithley 2450 (USA), Keithley 6510 (USA), Keithley 7709 (USA), Hall probe, cables, standard samples, sample holder, and system software. It is used to measure key parameters of semiconductor materials such as carrier concentration, mobility, resistivity, and Hall coefficient. These parameters are essential for understanding the electrical properties of semiconductor materials, making the Hall Effect Test System a necessary tool for studying semiconductor devices and materials. Experimental results are automatically calculated by the software, providing bulk carrier concentration, sheet carrier concentration, mobility, resistivity, Hall coefficient, magnetoresistance, and more.

Testable Materials

  • Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe, and ferrite materials;
  • Low-impedance materials: graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials;
  • High-impedance materials: semi-insulating GaAs, GaN, CdTe, etc.

Technical Specifications

  • Temperature range: 4K~325K (optional) 80K~523K (optional) Room temperature~730K (optional)
  • Magnetic field: 6000Gs at 20mm gap.
  • Sample current: 10nA~1000mA (minimum adjustable current: 0.1nA)
  • Measurement voltage: 0.1μV~200V
  • Various standard test materials and Hall devices of different grades (varying sensitivity and accuracy) are provided.
  • Minimum resolution: 0.1GS
  • Magnetic field range: 0~±6000Gs
  • Can communicate with computer via gaussmeter or data acquisition board.
  • I-V curve and I-R curve measurement, etc.
  • Carrier concentration: 5×1012~5×1022cm-3
  • Hall coefficient: ±1×10-2~±1×106cm3/C
  • Resistance range: 10mΩ-10MΩ
  • Resistivity: 5×10-5~5×103Ω·cm
  • Mobility: 1x101~1X105
  • Fully automated testing with one-click operation.
  • Professional ohmic contact kit.
Equipment Configuration List
No.NameQuantity
1Hall Effect Test System1
2Keithley 7709 (USA)1
3Keithley 2450 (USA)1
4Keithley 6510 (USA)1
5High-Precision Bipolar Power Supply JCP-10/40SA1
6Built-in Gaussmeter GP-51
7Laboratory Electromagnet EM-31
8Desktop Computer1
9Standard Sample1
10Ohmic Contact Kit1
11Test Holder1
12Standard Four-Point Probe Test Card1
13Power Cord4
14User Manual1
15Warranty Card1
16Certificate of Conformity1
17Factory Test Report1