Product Overview
The T-80 high and low temperature probe station enables non-destructive testing of devices up to 80mm (optional). It measures electrical and optoelectronic properties of materials or devices, providing a low-temperature test platform for DC, RF, and microwave measurements. Typical materials include nanoelectronic materials, quantum wires, quantum dots, and semiconductors. Various probes, test cables, and sample stages are available to meet diverse user needs.
The T-80 operates over a temperature range from 80K to 473.15K. It uses a high-precision electric heater for temperature variation, and a thermal radiation shield significantly reduces blackbody radiation, improving thermal efficiency. The sample stage is equipped with a temperature sensor and heater for rapid temperature changes and precise control.
The T-80 features four finely adjustable probe arms, each with a probe that can be precisely positioned in three dimensions. The probes are made of tungsten alloy with a tip diameter of 5 microns, minimizing heat conduction to the sample. Each probe arm is constructed from 304 stainless steel and G10, with effective heat sinking to reduce heat leakage and thermal impact on the sample.
To enhance usability and operability, the system is equipped with a high-magnification microscope.
Available Magnetic Field Probe Station Products
