Product Overview
The high and low temperature vacuum probe station T-80GD enables non-destructive testing of devices. It can measure electrical and optoelectronic properties of materials or devices, providing a high-temperature test platform for DC, RF, and microwave measurements. Typical materials tested on the probe station include nanoelectronic materials, quantum wires, quantum dots, and semiconductor materials. Various types of probes, test cables, and sample stages are available to meet different user needs.
The temperature range of T-80GD is from room temperature to 773.15K (optional), with PID temperature control. Controller resolution: ±0.1°C. Sensor temperature error: 0.5% in any zone. Temperature stability better than +/- 50mK. The system uses resistive heating for temperature variation, and a thermal radiation shield significantly reduces blackbody radiation, improving test efficiency. The sample stage is equipped with a temperature sensor and heater for rapid temperature change and precise temperature control.
The liquid nitrogen probe station T-80GD features four finely adjustable probe arms, each with probes that can be precisely positioned in three dimensions. The probes are made of beryllium or tungsten with a tip diameter of 1 micron, reducing heat conduction to the sample. Each probe arm is constructed from 304 high-quality stainless steel and G10, and each is effectively heat-sinked to minimize heat leakage from the probe arm and thus reduce heat transfer to the sample. This enhances the system's practicality and operability.
Available Magnetic Field Probe Station Products
